Microscopy lighting in darkfield

This illumination allows for working from a darkfield configuration to a low angle configuration (2-in-1).

Microscopy illumination in darkfield DF-5400

Dedicated to the inspection of prints and edges, the high lighting directionality of the DF-5400 provides comfortable working conditions for the inspection of the whole sample with naked eyes in a standalone use or for a more detailed examination under a microscope.

Easy to set-up and easy to interface to an optical system, the DF-5400 can be used with different microscopes such as Zeiss, Olympus, Nikon, Leica or other microscope brands.

In a darkfield configuration, a sharp light surrounds the sample from the side. This low angle illumination provides a unique and extremely high image contrast emphasizing the edges and prints of the sample. It gives key information on the manufacturing quality of metallic, glass or plastic components and enables the optimal detection of material deposits.

The color temperature of the darkfield is 5400 K (6500 K option on request). Independently of the number of hours the product is used, its light temperature remains constant throughout its longevity. This consistency enables the users to maintain a stable quality standard over time.

Your advantages

  • - High lighting directionality
  • - Naked eye inspection or in combination with a microscope
  • - Adaptable to different microscopes or cameras
  • - Easy to set-up
  • - Stable light quality over time
  • - No maintenance
  • - Possibility to combine it with a brightfield high angle illumination system (BF-5400)

Combination of bright and darkfield illumination under an Olympus microscope.

Combination of bright and darkfield illumination under a Zeiss microscope.

Examples of images taken with the DF-5400 under a microscope

Easy inspection of milling and drilling

Easy inspection of dusts

Excellent vision of carvings and markings quality

Easy inspection of the scratches and marking quality

See for yourself!

You are a professional and our solutions are of interest to your company? Contact us to organize a visit in our showroom and test the products on site. We would be happy to welcome you.


Elevation stage

It allows to adjust the height of the low angle ring light. It facilitates the precise inspection of samples at different heights ranging from 10 to 50 mm.

Diffuser DF

It delivers smoother image when observing very reflective components under low angle illumination. It can be attached and removed quickly.

Docking station

It allows to fix the different systems (bright- and darkfield) in a compact manner either directly on the microscope or on the workstation

Power supply

Available with EU, JP & UK interfaces, it enables the user to transport and to set up the illumination systems effortlessly.